Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction, X-Ray, Electron and Ion Spectrometry, Electron Microscopy

INTERACTION OF X-RAYS AND PARTICLE BEAMS WITH MATERIALS. Waves, Particle Beams and Matter. Basics on Radiation-Matter Interactions. Basic Theory of Elastic Scattering. Elastic Scattering by Individual Atoms: Atomic Scattering Amplitude. Diffraction by a Crystal. Basic Theory of Electron Diffraction. Secondary Emission. Absorption of Radiation in Materials. RADIATION GENERATION AND MEASUREMENT. Sources of X-Rays, Electrons, Thermal Neutrons and Ions. Radiation Detectors and Spectrometers. DIFFRACTION TECHNIQUES APPLIED TO MATERIAL ANALYSIS. X-Ray and Neutron Diffraction Applied to Crystalline Materials. Electron Diffraction on Thin Crystalline Layers. X-RAY, ELECTRON AND SECONDARY ION SPECTROMETRY APPLIED TO MATERIAL ANALYSIS. Important Parameters in Spectrometry. Elemental Analysis by X-Ray Fluorescence. Electron Probe Microanalysis. Electron Spectrometry for Surface Analysis. X-Ray Absorption Spectrometry and Electron Energy Loss Spectrometry. Secondary Ion Mass Spectrometry for Surface Analysis. TECHNIQUES OF ELECTRON MICROSCOPY. Transmission Electron Microscopy. Scanning Electron Microscopy. Scanning Transmission Electron Microscopy: Analytical Electron Microscopy. Scanning Tunneling Microscopy. Appendices. References. Index.Eberhart, J. P. is the author of 'Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction, X-Ray, Electron and Ion Spectrometry, Electron Microscopy' with ISBN 9780471929772 and ISBN 0471929778.