logo
Cancel

2025258

9783540206620

Nanoscale Characterisation of Ferroelectric Materials Scanning Probe Microscopy Approach

Nanoscale Characterisation of Ferroelectric Materials Scanning Probe Microscopy Approach
$155.49
$3.95 Shipping
List Price
$209.00
Discount
25% Off
You Save
$53.51
  • Condition: New
  • Provider: LightningBooks Contact
  • Provider Rating:
    85%
  • Ships From: Multiple Locations
  • Shipping: Standard, Expedited (tracking available)
  • Comments: Fast shipping! All orders include delivery confirmation.
seal  

Ask the provider about this item.

Most renters respond to questions in 48 hours or less.
The response will be emailed to you.
Cancel

Product details

  • ISBN-13: 9783540206620
  • ISBN: 3540206620
  • Publication Date: 2004
  • Publisher: Springer

AUTHOR

Alexe, M., Gruverman, Alexei

SUMMARY

A basic introduction to the field of nanoscale measurement of ferroelectric materials using scanning probe microscopy. It addresses imaging mechanisms and quantitative analysis in piezoelectric scanning probe microscopy as well as basic physics at nanoscale level in ferroelectrics.Alexe, M. is the author of 'Nanoscale Characterisation of Ferroelectric Materials Scanning Probe Microscopy Approach', published 2004 under ISBN 9783540206620 and ISBN 3540206620.

[read more]

Questions about purchases?

You can find lots of answers to common customer questions in our FAQs

View a detailed breakdown of our shipping prices

Learn about our return policy

Still need help? Feel free to contact us

View college textbooks by subject
and top textbooks for college

The ValoreBooks Guarantee

The ValoreBooks Guarantee

With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.