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6930389

9780262513357

Journey to Data Quality

Journey to Data Quality
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  • Condition: Like New
  • Provider: Bellwetherbooks Contact
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  • Ships From: McKeesport, PA
  • Shipping: Standard, Expedited
  • Comments: LIKE NEW!!! Has a red or black remainder mark on bottom/exterior edge of pages.
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Product details

  • ISBN-13: 9780262513357
  • ISBN: 0262513358
  • Publisher: MIT Press

AUTHOR

Lee, Yang W., Pipino, Leo L., Funk, James D.

SUMMARY

Lee, Yang W. is the author of 'Journey to Data Quality' with ISBN 9780262513357 and ISBN 0262513358.

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