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22937247

9780819467966

Instrumentation, Metrology, and Standards for Nanomanufacturing : 29-30 August 2007, San Diego, California, USA

Instrumentation, Metrology, and Standards for Nanomanufacturing : 29-30 August 2007, San Diego, California, USA

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Product details

  • ISBN-13: 9780819467966
  • ISBN: 0819467960
  • Publication Date: 2007
  • Publisher: SPIE

AUTHOR

Postek, Michael T., Allgair, John, Society of Photo-Optical Instrumentation Engineers Staff

SUMMARY

Postek, Michael T. is the author of 'Instrumentation, Metrology, and Standards for Nanomanufacturing : 29-30 August 2007, San Diego, California, USA', published 2007 under ISBN 9780819467966 and ISBN 0819467960.

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