5074512
9780198570547
Aimed at a broad readership across applied science, this illustrated text builds a consistent, self-supporting knowledge base of low-temperature apparatus design. Many recent developments in measurement techniques, superconductors, and scaling theory not previously published are covered.Ekin, Jack is the author of 'Experimental Techniques for Low-Temperature Measurements Cryostat Design, Material Properties, And Superconductor Critical-Current Testing', published 2006 under ISBN 9780198570547 and ISBN 0198570546.
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